Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron, Microscopy: Proceedings of a Workshop Held

Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron, Microscopy: Proceedings of a Workshop Held
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Excerpt from Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron, Microscopy: Proceedings of a Workshop Held at the National Bureau of Standards Gaithersburg, Maryland, October, 1-3, 1975

The Analytical Chemistry Division of the Institute for Materials Research, National Bureau of Standards, seeks to develop new techniques of chemical analysis and improve existing techniques. Part of the mission of nbs is to disseminate knowledge in the scientific and technical community. To aid in reaching this objective, the Analytical Chemistry Division has sponsored a series of workshops on various topics in analytical chemistry. The workshop topics are chosen to fulfill current needs for detailed discussions on sharply defined subjects in a wide variety of specialist areas. The objective is to bring together specialists from throughout the world to concentrate intensively on a particular subject in order to advance the state-of-the-art. It is often very difficult to achieve this goal at large international meetings where the size and diversity of topics presented often limits detailed discussion of special subjects. Past topics of these workshops and the published proceedings include: Quantitative Electron Probe Microanalysis (nbs Special Publication 298, available from editors), Aerosol Measurements (nbs Special Publication 4l2), Oil Pollution Monitoring (nbs Special Publication and Secondary Ion Mass Spectrometry (nbs Special Publication These proceedings are available from the Superintendent of Documents, Government Printing Office, washington, DC 20402. Further information on the workshops can be obtained by writing to the Division Office, Analytical Chemistry Division, National Bureau of Standards, Washington, DC 20234.

This volume contains the proceedings of a Workshop on the Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy. The three-day meeting involved participants from the United States and Europe. The workshop format consisted of a keynote talk on each topic followed by extensive discussions. The papers in this volume are based on the keynote talks augmented with some points raised in the discussion.

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